Wafer Sort
Cirtek Electronics Corporation extends its capability for Wafer Level Electrical Testing and Sorting.
Available wafer prober models such EG2001 and EG2080 can accommodate 6-inch wafers and 8-inch wafers with up to 4 mils wafer thickness.
All wafer probers are equipped with SE Probe Wafer Mapping and SMART Probe Technology for wafer sort requirements of either sampling only or 100% probing.
Options for separate and on-line inking is also available.